Characteristics of Semiconductor Device and  Multiplexer Control Method for Photovoltaic Panel Fault Diagnosis

Yong-Geun Seon; Hyun-Jin Shin; Eui-Seong Choi; Woo-Gyun Shin; Suk-Whan Ko

doi:10.7836/kses.2020.40.6.105

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2020 Vol.40, Issue 6 Preview Page Next Page

Research Article

Characteristics of Semiconductor Device and Multiplexer Control Method for Photovoltaic Panel Fault Diagnosis 태양광 패널 고장 진단기기를 위한 소자 특성 및 Mux 회로 제어 방법에 대한 연구

30 December 2020. pp. 105-111

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Abstract

In Korea, the annual installed PV capacity has increased over the years. However, the supply of photovoltaic panel fault diagnosis techniques for efficient management is stil insufficient. Thus, many research groups and companies have been developing photovoltaic panel fault diagnostic equipment to measure I-V characteristics (1500 V_Max. and 50 A_Max.) and calculate the power efficiency of photovoltaic panels to quickly detect faults. In these methods, the capacitor load is used to measure the I-V curve of the photovoltaic panel. In addition, a MOSFET is used for stable I-V measurement and Multiplexing, and a high sampling ADC is used for simultaneous and quick (6 s) multi-channel measurements.

Keywords

Photovoltaic panel fault diagnosis

Multiplexer control

Multichannel I-V measurement

Precise I-V measurement

High sampling ADC

키워드

태양광 패널 고장진단

Mux 회로 제어

다채널 I-V 측정

I-V 정밀측정

고속 ADC

References

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Information

Publisher :Korean Solar Energy Society
Publisher(Ko) :한국태양에너지학회
Journal Title :Journal of the Korean Solar Energy Society
Journal Title(Ko) :한국태양에너지학회 논문집
Volume : 40
No :6
Pages :105-111
Received Date : 2020-11-13
Revised Date : 2020-11-23
Accepted Date : 2020-11-23
DOI :https://doi.org/10.7836/kses.2020.40.6.105

Journal of the Korean Solar Energy SocietyISSN:1598-6411(Print) 2508-3562(Online)한국태양에너지학회

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